RICERCA ITALIANA     

Programmi di ricerca simili:

• 1 - Sviluppo di tecnologie innovative per l'assemblaggio di microprodotti ibridi
• 2 - Metodi basati sulla similarita' per la visione artificiale e il riconoscimento delle forme: Teoria, algoritmi, applicazioni
• 3 - Miglioramento delle prestazioni nanomeccaniche e della funzionalizzazione di superficie di cantilever, per una nuova classe di sensori di massa chimico-specifici
• 4 - Proprietà strutturali, morfologiche ed elettroniche di interfacce organico-organico e loro modificazioni in presenza di acqua.
• 5 - Nanotecnologie e funzionalizzazione delle superfici per il made in Italy (Made in Italy - Nanotech)
• 6 - Tecniche di Indicizzazione e Reperimento di Forme Tridimensionali (3-SHIRT)
• 7 - Sintesi automatica di modelli astratti a partire da dati temporali o spaziali
• 8 - Materiali fluorurati per il controllo dei fenomeni superficiali in sistemi micro- e nano-strutturati
• 9 - Future applicazioni del paradigma peer-to-peer
• 10 - FILM AUTOASSEMBLANTI DI OLIGOPEPTIDI SINTETICI PER SUPERFICI BIOMIMETICHE

Classificazione scientifico-disciplinare

• Area scientifico disciplinare: Ingegneria industriale e dell'informazione
  • TECNOLOGIE E SISTEMI DI LAVORAZIONE

Classificazione brevettuale

• PHYSICS
  • CONTROLLING; REGULATING (specially adapted to a particular field of use, see the relevant place for that field, e.g. A62C37/00, B03B13/00, B23Q)
    • CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (fluid-pressure actuators or systems acting by means of fluids in general F15B; valves per se F16K; characterised by mechanical features only G05G; sensitive elements, see the appropriate subclass, e.g. G12B, subclass of G01, H01; correcting units, see the appropriate subclass, e.g. H02K)
  • MEASURING (counting G06M); TESTING
    • MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J3/12; monitoring electronic pulse counters H03K21/40; monitoring operation of communication systems H04)
    • WEIGHING (sorting by weighing B07C5/16)

Classificazione geografica

• Regione: Emilia Romagna

Bibliografia

Acquisition, representation and characterization of surface geometry at different scales

Moalic H., Fitzpatrick J.A., Torrance A.A., (1989). A spectral approach to the analysis of rough surfaces. Transactions of the ASME, Journal of Tribology, 111.

Majumdar A., Bhushan B., (1990). Role of fractal geometry in roughness characterization and contact mechanics of surfaces. Transactions of the ASME, Journal of Tribology, 112.

Ushakov N.G., (1990). Models and algorithms of image processing of local SEM diagnostics, Journal of Crystal Growth, v 103, n 1-4, p 413-419.

Friedman, J. H. (1991). Multivariate adaptive regression splines (with discussion). Ann. Statist. 19, pp. 1-141.

Murata M., Mukai Y., Taguchi Y., Hotta M., (1991). Construction of 3-dimensional image by using a characteristics of secondary electron intensity with SEM and it's application, Quarterly Journal of the Japan Welding Society, v 9, n 3, p 134-138.

Dong W.P., Sullivan P.J., Stout K.J., (1992). Comprehensive study of parameters for characterising 3D surface topography I: some inherent properties of parameter variation. Wear, 167, pp. 9-21.

Dong W.P., Sullivan P.J., Stout K.J., (1993). Comprehensive study of parameters for characterising 3D surface topography II: statistical properties of parameter variation. Wear, 167, pp. 9-21.

Dong W. P., Sullivan P. J.,Stout K. J., (1994). Comprehensive study of parameters for characterising 3D surface topography III: parameters for characterising amplitude and some functional properties, & IV: parameters for characterising spatial and hybrid properties. Wear, 178, pp. 29-60.

ISO/TR 14638: 1995 (1995). Geometrical Product Specifications (GPS) – Masterplan

Chen, X., Raja, J., Simanapalli, S., (1995). Multi-scale analysis of engineering surfaces. International Journal ofMachine Tools & Manufacture , 32, 231-238.

Podsiadlo P.; Stachowiak G.W.; (1997). Characterization of surface Topography of Wear Partlicles by SEM Stereoscopy; Wear v 206, p 39-52.

Sherrington I., Smith E.H., (1998). Modern measurement techniques in surface metrology; part I: stylus instruments, electron microscopy and non-optical comparators; and part II: optical instruments. Wear, 125, 3, pp. 271-308.

Lee, S-H., Zahouani, H., Caterini, R., Mathia, T.G., (1998). Morphological characterization of engineered surfaces by wavelet transform. International Journal of Machine Tools & Manufacture , 38, 581-589.

Vidakovic, B., (1999). Statistical Modeling by Wavelets. New York: JohnWiley & Sons.

Artigas R., Pinto A., Laguarta F., (1999). Three-dimensional micromeasurements on smooth and rough surfaces with a new confocal optical profiler, Proceedings of SPIE - The International Society for Optical Engineering, v 3824, p 93-104.

Stout K.J., Blunt L., (2000). Three Dimensional Surface Topography, Penton Press, London.

Jiang X.Q., Blunt L., Stout K.J., (2000). Development of a lifting wavelet representation for surface characterization. Proceedings of the Royal Society of London, 456, pp. 2283-2313.

Capello E., Semeraro Q. (2001) The harmonic fitting method for assessment of the substitute geometry estimate error. Part I: 2D and 3D theory, International Journal of Machine Tools and Manufacture, 41(8), pp. 1071-1102, + Part II: statistical approach, machining process analysis and inspection plan optimization, pp. 1103-1199.

Xue X.J., Sun C.K., Ye S.H., (2001). Laser scanning on-line inspection system for ball grid array coplanarity measurement, Opto-Electronic Engineering, v 28, 1, p 39-42

De Boor, C., (2001). A practical guide to splines, Revisited Edition, Springer – Verlag, New York.

Cho, N. W., Tu, J. F. (2001) Roundness modeling of machined parts for tolerance analysis, Precision Engineering, 25, pp. 35-47.

Lonardo P.M.; Lucca D.A.; De Chiffre L., (2002). Emerging Trends in Surface Metrology; Annals of the CIRP, Vol. 51, n.2.

Lee, T.C.M. (2002), On algorithms for ordinary least squares regression spline fitting: a comparable study. J. Statist. Comput. Simul., vol. 72(8). Pp. 647-663.

Groppetti R., Senin N., (2003), A contribution to the development of three-dimensional nano and micro-topography measurement and analysis techniques and systems. 11th International Metrology Congress, Toulon, France.

Muralikrishnan B., Raja J., Najarian, K., (2003). Surface wavelength content based clustering using neural networks for manufacturing process mapping. International Journal of Machine Tools & Manufacture 43, 369-377.

Special Issue on Multiscale Fabrication/Integration (2004), Journal of Manufacturing Processes vol.9 n.1.

Colosimo, B. M., Moroni, G., Petro', S., Semeraro, Q. (2004) Manufacturing signature of turned circular profiles, IFAC Conference on Manufacturing, Modeling, Management and Control, Athens, Greece, 21-22 October.

Senin N.,Groppetti R., (2004), On the application of segmentation techniques to three-dimensional surface topography analysis of engineered surfaces. 4th CIRP International Seminar on Intelligent Computation in Manufacturing Engineering (ICME), Sorrento, Italy.

Calio' F., Miglio E., Moroni G., Rasella M. (2004). Integral λ-τ Bivariate Spline Operators In Computer Graphics Problems. Studia Universitatis Babes-Bolyai Mathematica (vol. XLIX 4 pp. 43-53).

Geometric Tolerancing

ElMaraghy H.A. (Ed.), (1998). Geometric Design Tolerancing: Theories, Standards and Applications, Chapman & Hall.

Weckenmann A., Ernst R., Hornfeck R., (2000). Studies on new tolerancing rules for micro and nanotechnology, Prof. of the 1st EUSPEN Topical Conference, Copenaghen, Denmark,pp. 214-221.

Hong Y.S., Chang T.C., (2002). A comprehensive review of tolerancing research, Int. J. Prod. Res., vol. 40, no. 11, pp. 2425-2459.

Moroni G., Polini W. (2003). Tolerance-based variations in solid modeling. Journal Of Computing And Information Science In Engineering. vol. 3 pp. 345-352.

Germer C., Hansen U., Franke H.J., Buttgenbach S., (2004). Computer Aided Tolerance Analysis and Synthesis in Micro Systems, Analog Integreted Circuits and Signal Processing, vol. 40, pp. 131-140.

Whitney D. E., (2004). Mechanical assemblies. Their design, manufacture and role in production development, Oxford University Press Inc..

Statistical process control

Box, G.E.P., Jenkins, G.M. and Reinsel, G.C. (1970), Time Series Analysis, Forecasting and Control (3rd edition 1994) Prentice Hall.

Hamilton, J.D. (1994), Time Series Analysis, Princeton University Press, ch. 10-13.

Zorriassantine, F., Tannock, J.D.T., (1998). A review of neural networks for statistical process control. Journal of Intelligent Manufacturing, 9, 209-224.

Ljung, L. (1999), System Identification Theory for the User, Second edition, Prentice Hall.

Raj, K.H., Sharma, R.S., Srivastava, S., Patvardhan, C., (2000). Modeling of manufacturing processes with
ANNs for intelligent manufacturing, International Journal of Machine Tools and Manufacture, 40, 851-868.

Kim, K., Mahmoud, M. A. and Woodall, W. (2003), On the Monitoring of Linear Profiles, Journal of Quality Technology, v. 35 n. 3, pp.317-328.

Vargas N. J. A., (2003) Robust Estimation in Multivariate Control Charts for Individual Observations, Journal of Quality Technology, 35, pp. 367-376.

Del Castillo, E., Pan, R. and Colosimo, B.M. (2003), An Unifying view of some Process Adjustment Methods, Journal of Quality Technology, vol. 35 N. 3.

Del Castillo, E., Pan, R. and Colosimo, B.M. (2003), Small Sample Performance of some Statistical Setup Adjustment Methods, Communications in statistics - Simulation and Computation, Vol. 32 N. 3, pp. 923 - 941.

Pacella, M., Semeraro, Q., Anglani, A., (2004). Adaptive Resonance Theory based neural algorithms for manufacturing process quality control. International Journal of Production Research, 42(21), 4581-4607.

Woodall, W. H., Spitzner, D. J., Montgomery, D. C. Gupta, S. (2004), Using Control Charts to Monitor Process and Product Quality Profiles, Journal of Quality Technology, 36, pp. 309-320.

Parole Chiave

GEOMETRIA MULTISCALARE DI PROFILI E SUPERFICI; METROLOGIA; ANALISI DELLE TOLLERANZE; CONTROLLO STATISTICO DI PROCESSO